A W thesis

Introduction

Methods of determining atomic concentration in Material

Particle-induced X-ray Emission (PIXE)

Another method, uses X-ray from a synchrotron light source and look at the de-excitation of atomic electrons to measure the atomic number. Reports are that they can measure pico-gram quantities.

table of detection limits -vs- Method

Coincidence Counting Setup

A_W_CAA_apparatus

Y-88 CAA

Run6980_Y88

Run7023_Y88

Run7108_Y88

Run7161_Y88

Run7204_Y88

Background subtraction

Do the fit:

get parameters for line

Then fill 1 histogram with line

Then subtract

TH1F *coin1=new TH1F("coin1","coin1",30,1800,1860);

ntuple->Draw("ADC7*0.604963-49.7001 >>coin1")

TH1F *lin1=new TH1F("lin1","line1",30,1800,1860);

for(int i=1800;i<1861;i++){
lin1->Fill(i,-2028+1.12*i)
}

TH1F *sub1=new TH1F("sub1","sub1",30,1800,1860);

sub1->Add(coin1,1);
sub1->Add(lin1,-1);

sub1->Draw();

Ba-133 CAA

BO-08-22-13

Useful commands

Converting CODA data file to ROOT

make sure the CODA and ROOT environmental variables are setup by source the following scripts

source ~/CODA/setup

source ~/ROOT/root/bin/thisroot.csh

Now change to the data subdirectory and execute the program to convert the data file to root

cd /data

~/CODA/CODAreader/ROOT_V5.30/V785V792/evio2nt -fr6994.dat > /dev/null

rename the file so it has the .root extension allowing ROOT to identify it in the browser

mv r6994 r6994.root

Calibration work

AW_ADC_7_Histogram

AW_ADC_3_Histogram

System's intrinsic err

Plot calibration parameters as a function of time

determine the variance of the parameters using several (>20) fits

Impact of higher order fits

Plot [math]E_{expected} - E_{fit} -vs- E_{expected}[/math]

Variance comes from several fits,.

Compare uncertainty when fit is E-vs-Channe to Channel-vs-E

Probably should use %error for the weighting

Concentration measurement

A comparison of the measure concentrations using singles and coincidence counting

PAA_Research