Difference between revisions of "TF Scratch"

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-TJP:  Assoc in electonics
-D_C:  already interviewed (2nd)
-G_D: Interviewed before (3rd)
-PWP:  Electrical Engineer
-JRN: BS physics 2010
-PEA:  microbiology
-MDG: 14 years at Intel
-JRB:  CoT 2003 in laer optics,
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-ADJ:  Graduated as Electrical Tech in 2011, may have trouble focusing on feedthrough
-BDB:  Electronics, May have trouble focusing
-BMP:  Associates in Electromech tech, last 10 years at Intel in lithography
-CWS:  May have trouble focusing on feedthrough
-CAE:  EE, may have trouble focusing
-CJS:  Biology,
-DBK:  trouble focusing
-DCP:  Trouble focusing
-DKI:  Trouble focusing
-JSH:  trouble focusing, micron 1991-2006
-JBP: Trouble focusing
-LDM: Trouble focusing
-L_G: trouble focusing
-MBC: trespassing, welder,
-M_D:  trouble focusing
-RLM:  trouble focusing
-RJM:  trouble focusing
-RJM2:  trouble focusing
-RJB:  trouble focusing
-RJK:  trouble focusing
-SMH:  bilogy, manual laborer
-SJP:  trouble focusing
-TMH:  trouble focusing

Latest revision as of 03:19, 13 May 2012