Difference between revisions of "TF NEAMS-2"
| Line 8: | Line 8: | ||
Use a 2 MeV Xenon beam to irradiate a diving board that is machined out of 2 mm UO2 pins from INL. | Use a 2 MeV Xenon beam to irradiate a diving board that is machined out of 2 mm UO2 pins from INL. | ||
| − | + | 1.) An arcticle that measured how the strength of UO2 changes with temperature and grain size. | |
| + | The strength and fracture of stoichiometric polycrystalline UO2 | ||
| + | , A.G.EvansR.W.Davidge, Journal of Nuclear Materials Volume 33, Issue 3, December 1969, Pages 249-260 | ||
Revision as of 01:50, 5 July 2019
User_talk:Foretony#TF_NEAMS-2 NEAMS-2
Diving board proposal
Use a 2 MeV Xenon beam to irradiate a diving board that is machined out of 2 mm UO2 pins from INL.
1.) An arcticle that measured how the strength of UO2 changes with temperature and grain size. The strength and fracture of stoichiometric polycrystalline UO2 , A.G.EvansR.W.Davidge, Journal of Nuclear Materials Volume 33, Issue 3, December 1969, Pages 249-260
References
Use 2 MeV protons to irradiate zirconium to study the temperature dependence of the initial recombination. The incident proton causes surface damage on the zirconium during the ballistic phase knout out. Recombination occurs afterwards and can be temperature dependent.
2.6 MeV proton irradiation effects on the surface integrity of depleted UO2 (effects seen after 10^{17} protons/cm^2 ) https://www.sciencedirect.com/science/article/pii/S0168583X1301152X
Media:Zr-Alpha_IradDamageSimul_O_Trachenko_2001.pdf
Media:Zr-IrradDamage_Zarkadoula_2014.pdf
article on silicon damage from ions
https://www.sciencedirect.com/science/article/pii/S0168583X14002183
measuring ion damage to UO2 using Raman scattering
Appl. Phys. Lett. 100, 251914 (2012); https://doi.org/10.1063/1.4729588 File:Guijmbretiere APL 2012.pdf
Atom Probe Tomography
Atom Probe Tomography used to study Uranium oxide
Valderrama, B. et al. Investigation of material property influenced stoichiometric deviations as evidenced during UV laser-assisted atom probe tomography in fluorite oxides. Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms 359, 107–114 (2015).