Alpha Ionization

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Alpha particles are highly ionizing and represent the main source for charge in QDC's charge spectrum. Alpha particles are mostly emitted by heavy radioactive nuclei; alpha kinetic energy is dependent on the mass difference before and after emission. For U-233, 85% of alpha particles has energy of 4.82 MeV when U-233 decays to an alpha particle and Th-229.<ref name ="Akovali"> Akovali, Y. (1990, January 1). Table of Radioactive Isotopes. Retrieved January 1, 2014. </ref>

Performing the simulation for alpha charge passed over specific stages started by using alpha's emission rates. A simulation was benchmarked with published data to determine the amount of primary ionization produced from a single alpha particle for a given energy, the ionization that took place when the primary electrons were accelerated in an external elective field, then the multiplication (gain) by the triple GEM preamplifier structure. And finally, the simulation showed the impact of the shutter on alpha ionization when an FR4 shutter was in front of the U-233 coating.


Alpha emission rates and their energies

Alpha particles has a continuous energy spectrum, which also give relative rates for the emitted alpha. The figure below shows the relative rates for each alpha,

Alpha energy percentages.png < ref name="Akovali"/>

Alpha particles of an energy of 4.82 MeV has the highest rate of 85 percent compared to the other alpha energies' rates.

The number of alpha and beta particles were measured in the lab <ref> Roy Don</ref>. Before installing U-233 source to be a part of the detector cathode, the number of alpha and beta particles were measured using a standard calibrated drift chamber as shown in the table below,


Shutter position Alpha particles /min. Beta particles /min.
Open 6879 900
Close 1 38

The table shows that the shutter almost stopped all alpha and beta particles as it covered the source. Depending on alpha relative intensities, the source rate for emitting 4.82 MeV alpha (most probable) is 97 Hz.

An alpha particle's primary and secondary ionization

The electric field determines the number of primary and secondary electrons in pure argon gas. When an alpha particle travels in pure argon, it liberates up to 30,000 electrons for primary and secondary ionization <ref> Fabio, S. (2014). Basic processes in gaseous counters. In Gaseous Radiation Detectors: Fundamentals and Applications. Cambridge: University Printing House </ref> without any electric field effect. On the other hand, Saito <ref name = "saito"> Saito, K., & Sasaki, S. (2003). Simultaneous Measurements of Absolute Numbers of Electrons and Scintillation Photons Produced by 5.49 MeV Alpha Particles in Rare Gases. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 50(6), 2452-2460 </ref> measured the number of primary and secondary electrons for a 5.49 MeV alpha particle when a 4.7 kV/cm drift electric field collected the free electrons in the drift area to a collector, the number of collected electrons reached to 200k electron. Saito's measurements shows that the collector almost counts for all electrons, so the electric field decreases the probability of any electron-ion reattachment.

Simulations of GEANT4 <ref> Agostinelli, S. (2003). Geant4—a simulation toolkit. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 506(3), 250–303 </ref> and Srim/Trim <ref>Ziegler, J. (2010). SRIM - The stopping and range of ions in matter (2010). Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 268(11-12), 1818-1823 </ref> were used to estimate the number of primary and secondary electrons for an alpha particle, both of the tools are able to calculate the number of primary and secondary electrons in a specific gaseous medium with specific physical conditions for pressure, temperature, and density. The model in each tool was tested by estimating the range in Ar and CO2 gases; the results are shown below:

Alpha range measured simulated.png Alpha range measured simulated CO2.png

According to the figures above, G4 succeeded to simulate the alpha range accurately in Ar and CO2 gases, but the Srim/Trim model estimated the range with 50 percent less than that measured by Hanke and Bichsel <ref> Hanke, C., & Bichsel, H. (1970). Precision energy loss measurements for natural alpha particles in argon. Kbh.: Det Kongelige Danske Videnskabernes Selskab </ref> in pure argon, while on the other hand, Srim/Trim estimated the same range of 4 cm for different alphas' energies in CO2.

G4 simulated the number of primary and secondary electrons in 1 cm of Ar/CO2 90/10 gas mixture, and the figures below show the results:

G4 1cmAr90CO2 alpha primaryElecN.png G4 1cmAr90CO2 alpha SecondElecN.png


G4 estimated 2.7k secondary electrons when a 5.49 MeV alpha penetrated 1cm of the same medium without any applied electric field, the estimation is close to Saito's measurements, which could be interpreted that G4 did not consider the reattachment of the electrons as they were collected in the drift area to end up counting for all the free electrons in the gas. On the other hand, the Scrim and Trim simulation for alpha particles ionizing 1cm of pure Ar gas estimated about 1 MeV deposited energy in the medium within that distance; it made the final number of electrons around 37.5k electron (considering w = 26.7 eV/ip), which is the same estimation mentioned by Sauli.

Triple GEM gain

Garfield, well-known in simulating the interactions in gaseous media such as electron multiplication <ref> Garfield++. (n.d.). Retrieved June 1, 2013. </ref>, simulated the electron multiplication in Ar/CO2 gas in GEM detector. Garfield simulated the physical processes that occurred in triple GEM based detector by using more than one software package together, it uses HEED and Magboltz that simulate electron interactions in different gases, and give the solution for the Boltzmann equation in 3D. It also uses a finite element method (FEM) package to map the electric field within specific boundary conditions of GEM preamplifiers.

Garfield simulated a triple GEM detector electron multiplication in more than one region in GEM detector. When the electric field of 1-4kV/cm drives the electrons toward the first GEM preamplifier in 1cm drift region, electrons interacts with the gas atoms and molecules, According to Garfield simulation for the drift region, An electron multiplies to 8 +_1 electrons before it reaches the first GEM preamplifier. Garfield also simulated the gain for a triple GEM stack for Ar/CO2 93/7, the figure below shows the results:

Ref data gain triple Ar93 CO2.png



t is also supported by scripts to help in simulating different interactions. One of the scripts was used to simulate triple GEM detector multiplication after testing the the script output by simulating the triple GEM gain that is shown below,


which explained increasing the number of the electrons by ionization to 200k electron for an alpha particles < ref name = "saito"/>, as the free electrons travelled through the drift area, a multiplication of order of 8+_1 electrons was generated by accelerating the incident electrons by the 4.7 kV/cm drift electric field, by dividing 200 k electron by 8, the result was 25k electron is the number for each alpha particle before multiplication, and it is within the same order as one predicted by Scrim/Trim and Sauli.


Triple GEM gain 70 30 reference.png

Garfield simulated the gain when the voltage for each GEM detector is 466V in average, the gain is 1.1617 x 10^4 +_1099 for 293k and 1021 Pa.

In our case, by the end of the drift area, the electron will have 3 stages of multiplication by GEM preamplifiers, the voltage on the potential divider circuit is 2800 kV, which will provide 300-350 V on each GEM preamplifier. Garfield succeeded to simulate the gain for 2.8 kV triple GEM in Ar/CO2 90/10 gas mixture under STP conditions of an average value of 7.88 +_ 2.8 x 10^3. So, the charge collected by the charge collector for 4.82 MeV alpha particles is expected to be:

[math] charge =\left ( 7.88 \times 10^3 \times 2\times 10^5 \mbox {e}^-\right ) \left (1.6 \times* 10^{-19} \frac{\mbox{Coul}}{\mbox{e}^-}\right)= 2.52 \times 10^{-10} C = 25.2 nC [/math]

The figure below shows the signal processing electronics configuration,


LDC daq electronics 02 20.png

A signal of an amplitude 11.8 mV passed through the loop to output a 20.8 mV amplitude signal as shown by a 50 ohm terminated oscilloscope, using the figure below, the amount charge that ADC collected is,

[math] Charge = \frac{11.8}{20.8} \times 0.25 nC = [/math]


QDC cal 02 22 15.png QDC charge 2.87 3.87kV 02 17 15.png

FR4 Shutter Effect

A 1 cm FR4 shutter stops all Alpha particles that are emitted from U-233, the following figure shows the percentage of the number of alphas that penetrate the shutter,

G4 alpha tran FR4 vacuum.png

For a complete penetration, alpha's energy has to be around 60 MeV. It is Previously mentioned that the emitted alpha particles from U-233 has a maximum energy of 8.4 MeV, So the shutter is able to stop all the emitted alpha particles without any scintillation. The simulation result agrees with Saito's experiment which confirms that travelling in a 1cm argon gas with 4.5 kV/cm electric field is one of the ways to study alpha's scintillations.


03/05/15 Measuring the GEM charge from the oscilloscope

A 50 ohm terminated oscilloscope measured the pulse that comes directly from the tripe GEM trigout as the voltage 2.8, 3.8 kV for the triple GEM and the cathode successively, the triangle pulse amplitude is 19 mV, and it width is 299 ns, if the pulse represents an alpha ionization, then the number of alphas considering the charge received directly from the trigout is,

[math] \mbox{Number of alphas} = \frac{0.5 * \frac{21.4 \mbox{mV}}{50 \Omega} *302 ns }{25 \frac{nC}{alpha}} = 2.59 [/math]

GEM 2.8 3.8 03 05 15 p1.png GEM 2.8 3.8 03 05 15 p2.png GEM 2.8 3.8 03 05 15 p3.png

Also the number of alphas for the second figure is 1.6, and for the third one is 2.1.

alpha particle simulation related

<References/>


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File:Excitation ionization ratio saito 2003.pdf