TF Scratch

D_C: already interviewed (2nd)

G_D: Interviewed before (3rd)

JRN: BS physics 2010

JRB: CoT 2003 in laer optics,

MDG: 14 years at Intel

PEA: microbiology

PWP: Electrical Engineer

TJP: Assoc in electonics,

---

ADJ: Graduated as Electrical Tech in 2011, may have trouble focusing on feedthrough

BDB: Electronics, May have trouble focusing

BMP: Associates in Electromech tech, last 10 years at Intel in lithography

CWS: May have trouble focusing on feedthrough

CAE: EE, may have trouble focusing

CJS: Biology,

DBK: trouble focusing

DCP: Trouble focusing

DKI: Trouble focusing

JSH: trouble focusing, micron 1991-2006

JBP: Trouble focusing

LDM: Trouble focusing

L_G: trouble focusing

MBC: trespassing, welder,

M_D: trouble focusing

RLM: trouble focusing

RJM: trouble focusing

RJM2: trouble focusing

RJB: trouble focusing

RJK: trouble focusing

SMH: bilogy, manual laborer

SJP: trouble focusing

TMH: trouble focusing