Difference between revisions of "TF Scratch"

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Line 12: Line 12:
 
PEA:  microbiology  
 
PEA:  microbiology  
  
PWP:  Electrical Engineer,  
+
PWP:  Electrical Engineer
 +
 
 +
TJP:  Assoc in electonics,  
  
 
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Line 46: Line 48:
  
 
M_D:  trouble focusing
 
M_D:  trouble focusing
 +
 +
RLM:  trouble focusing
 +
 +
RJM:  trouble focusing
 +
 +
RJM2:  trouble focusing
 +
 +
RJB:  trouble focusing
 +
 +
RJK:  trouble focusing
 +
 +
SMH:  bilogy, manual laborer
 +
 +
SJP:  trouble focusing
 +
 +
TMH:  trouble focusing

Revision as of 23:18, 2 January 2012

D_C: already interviewed (2nd)

G_D: Interviewed before (3rd)

JRN: BS physics 2010


JRB: CoT 2003 in laer optics,

MDG: 14 years at Intel

PEA: microbiology

PWP: Electrical Engineer

TJP: Assoc in electonics,

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ADJ: Graduated as Electrical Tech in 2011, may have trouble focusing on feedthrough

BDB: Electronics, May have trouble focusing

BMP: Associates in Electromech tech, last 10 years at Intel in lithography

CWS: May have trouble focusing on feedthrough

CAE: EE, may have trouble focusing

CJS: Biology,

DBK: trouble focusing

DCP: Trouble focusing

DKI: Trouble focusing

JSH: trouble focusing, micron 1991-2006

JBP: Trouble focusing


LDM: Trouble focusing

L_G: trouble focusing

MBC: trespassing, welder,

M_D: trouble focusing

RLM: trouble focusing

RJM: trouble focusing

RJM2: trouble focusing

RJB: trouble focusing

RJK: trouble focusing

SMH: bilogy, manual laborer

SJP: trouble focusing

TMH: trouble focusing