Difference between revisions of "TF Scratch"

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Line 1: Line 1:
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D_C:  already interviewed (2nd)
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G_D: Interviewed before (3rd)
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JRN: BS physics 2010
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 +
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JRB:  CoT 2003 in laer optics,
 +
 +
MDG: 14 years at Intel
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 +
---
  
 
ADJ:  Graduated as Electrical Tech in 2011, may have trouble focusing on feedthrough
 
ADJ:  Graduated as Electrical Tech in 2011, may have trouble focusing on feedthrough
Line 11: Line 23:
  
 
CJS:  Biology,  
 
CJS:  Biology,  
 
  
 
DBK:  trouble focusing
 
DBK:  trouble focusing
 
D_C:  already interviewed (2nd)
 
  
 
DCP:  Trouble focusing
 
DCP:  Trouble focusing
Line 21: Line 30:
 
DKI:  Trouble focusing
 
DKI:  Trouble focusing
  
G_D: Interviewed before (3rd)
+
JSH: trouble focusing, micron 1991-2006
 +
 
 +
JBP: Trouble focusing
 +
 
 +
 
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LDM: Trouble focusing
 +
 
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L_G: trouble focusing
  
JSH: trouble focusing, micron 1991-2006
+
MBC: trespassing, welder,
  
JRN: BS physics 2010
+
M_D: trouble focusing

Revision as of 23:11, 2 January 2012

D_C: already interviewed (2nd)

G_D: Interviewed before (3rd)

JRN: BS physics 2010


JRB: CoT 2003 in laer optics,

MDG: 14 years at Intel

---

ADJ: Graduated as Electrical Tech in 2011, may have trouble focusing on feedthrough

BDB: Electronics, May have trouble focusing

BMP: Associates in Electromech tech, last 10 years at Intel in lithography

CWS: May have trouble focusing on feedthrough

CAE: EE, may have trouble focusing

CJS: Biology,

DBK: trouble focusing

DCP: Trouble focusing

DKI: Trouble focusing

JSH: trouble focusing, micron 1991-2006

JBP: Trouble focusing


LDM: Trouble focusing

L_G: trouble focusing

MBC: trespassing, welder,

M_D: trouble focusing