Difference between revisions of "CH Outline"
Jump to navigation
Jump to search
Line 5: | Line 5: | ||
− | + | Talk about measurement, why measure it, prediction on how well you can measure it | |
− | |||
− | |||
− | |||
Latest revision as of 21:59, 9 November 2021
- Damaged vs undamaged materials
- 1D doppler broadening using PAS - talk to Chuting about sourcing materials
Talk about measurement, why measure it, prediction on how well you can measure it
Goals:
Investigate defects in previously damaged materials using positron annihilation spectroscopy.
Determine the change Doppler broadened peaks in damaged materials throughout the annealing process.
Outcomes:
Quantify the annealing process by analysis of the change in Doppler broadened peaks.
(as damage lessens throughout annealing process, the 511KeV peak should become sharper)
Benefits: