Difference between revisions of "TF NEAMS-2"
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| + | NEAMS | ||
| + | Use 2 MeV protons to irradiate zirconium to study the temperature dependence of the initial recombination. The incident proton causes surface damage on the zirconium during the ballistic phase knout out. Recombination occurs afterwards and can be temperature dependent. | ||
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| + | 2.6 MeV proton irradiation effects on the surface integrity of depleted UO2 (effects seen after 10^{17} protons/cm^2 ) | ||
| + | https://www.sciencedirect.com/science/article/pii/S0168583X1301152X | ||
| + | |||
| + | [[Media:Zr-Alpha_IradDamageSimul_O_Trachenko_2001.pdf]] | ||
| + | |||
| + | [[Media:Zr-IrradDamage_Zarkadoula_2014.pdf]] | ||
| + | |||
| + | article on silicon damage from ions | ||
| + | |||
| + | https://www.sciencedirect.com/science/article/pii/S0168583X14002183 | ||
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| + | |||
| + | measuring ion damage to UO2 using Raman scattering | ||
| + | |||
| + | Appl. Phys. Lett. 100, 251914 (2012); https://doi.org/10.1063/1.4729588 [[File:Guijmbretiere_APL_2012.pdf]] | ||
| + | |||
| + | ====Atom Probe Tomography ==== | ||
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| + | Atom Probe Tomography used to study Uranium oxide | ||
| + | |||
| + | Valderrama, B. et al. Investigation of material property influenced stoichiometric deviations as evidenced during UV laser-assisted atom probe tomography in fluorite oxides. Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms 359, 107–114 (2015). | ||
[[User_talk:Foretony#TF_NEAMS-2]] | [[User_talk:Foretony#TF_NEAMS-2]] | ||
Revision as of 23:36, 4 July 2019
User_talk:Foretony#TF_NEAMS-2 NEAMS
Use 2 MeV protons to irradiate zirconium to study the temperature dependence of the initial recombination. The incident proton causes surface damage on the zirconium during the ballistic phase knout out. Recombination occurs afterwards and can be temperature dependent.
2.6 MeV proton irradiation effects on the surface integrity of depleted UO2 (effects seen after 10^{17} protons/cm^2 ) https://www.sciencedirect.com/science/article/pii/S0168583X1301152X
Media:Zr-Alpha_IradDamageSimul_O_Trachenko_2001.pdf
Media:Zr-IrradDamage_Zarkadoula_2014.pdf
article on silicon damage from ions
https://www.sciencedirect.com/science/article/pii/S0168583X14002183
measuring ion damage to UO2 using Raman scattering
Appl. Phys. Lett. 100, 251914 (2012); https://doi.org/10.1063/1.4729588 File:Guijmbretiere APL 2012.pdf
Atom Probe Tomography
Atom Probe Tomography used to study Uranium oxide
Valderrama, B. et al. Investigation of material property influenced stoichiometric deviations as evidenced during UV laser-assisted atom probe tomography in fluorite oxides. Nucl. Instruments Methods Phys. Res. Sect. B Beam Interact. with Mater. Atoms 359, 107–114 (2015).