CH Outline: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
| (One intermediate revision by the same user not shown) | |||
| Line 1: | Line 1: | ||
- Damaged vs undamaged materials | |||
- 1D doppler broadening using PAS | |||
- talk to Chuting about sourcing materials | |||
Talk about measurement, why measure it, prediction on how well you can measure it | |||
Goals: | Goals: | ||
| Line 4: | Line 15: | ||
Determine the change Doppler broadened peaks in damaged materials throughout the annealing process. | Determine the change Doppler broadened peaks in damaged materials throughout the annealing process. | ||
Latest revision as of 21:59, 9 November 2021
- Damaged vs undamaged materials
- 1D doppler broadening using PAS - talk to Chuting about sourcing materials
Talk about measurement, why measure it, prediction on how well you can measure it
Goals:
Investigate defects in previously damaged materials using positron annihilation spectroscopy.
Determine the change Doppler broadened peaks in damaged materials throughout the annealing process.
Outcomes:
Quantify the annealing process by analysis of the change in Doppler broadened peaks.
(as damage lessens throughout annealing process, the 511KeV peak should become sharper)
Benefits: