CH Outline: Difference between revisions
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- Damaged vs undamaged materials | |||
- 1D doppler broadening using PAS | |||
- talk to Chuting about sourcing materials | |||
Talk about measurement, why measure it, prediction on how well you can measure it | |||
Goals: | Goals: | ||
Determine the change | Investigate defects in previously damaged materials using positron annihilation spectroscopy. | ||
Determine the change Doppler broadened peaks in damaged materials throughout the annealing process. | |||
| Line 8: | Line 22: | ||
Outcomes: | Outcomes: | ||
Quantify the annealing process by analysis of the change in Doppler broadened peaks. | |||
(as damage lessens throughout annealing process, the 511KeV peak should become sharper) | |||
Latest revision as of 21:59, 9 November 2021
- Damaged vs undamaged materials
- 1D doppler broadening using PAS - talk to Chuting about sourcing materials
Talk about measurement, why measure it, prediction on how well you can measure it
Goals:
Investigate defects in previously damaged materials using positron annihilation spectroscopy.
Determine the change Doppler broadened peaks in damaged materials throughout the annealing process.
Outcomes:
Quantify the annealing process by analysis of the change in Doppler broadened peaks.
(as damage lessens throughout annealing process, the 511KeV peak should become sharper)
Benefits: