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(Created page with "''temporal X-Ray monitoring''' *[http://link.springer.com/article/10.1134%2FS1063780X06120051] *several X-Ray vacuum diodes (XRDs): for extreme ultraviolet (XUV) diagnostic *sev…") |
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| − | ''temporal X-Ray monitoring''' | + | '''temporal X-Ray monitoring''' |
*[http://link.springer.com/article/10.1134%2FS1063780X06120051] | *[http://link.springer.com/article/10.1134%2FS1063780X06120051] | ||
*several X-Ray vacuum diodes (XRDs): for extreme ultraviolet (XUV) diagnostic | *several X-Ray vacuum diodes (XRDs): for extreme ultraviolet (XUV) diagnostic | ||
| Line 9: | Line 9: | ||
| − | '''spatial X-Ray | + | '''spatial X-Ray monitoring''' |
*[http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1710122&tag=1] | *[http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1710122&tag=1] | ||
*point-projection imaging to estimate the size of the X-Ray bright spots | *point-projection imaging to estimate the size of the X-Ray bright spots | ||
| Line 16: | Line 16: | ||
'''spectral X-Ray monitoring''' | '''spectral X-Ray monitoring''' | ||
*[http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1710122&tag=1] | *[http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1710122&tag=1] | ||
| − | * | + | *focusing spectrograph with spatial resolution (FSSR) (based on spherically bent mica crystal spectrograph) |
| + | *convex crystal spectrograph | ||
*flat KAP spectrograph | *flat KAP spectrograph | ||
*pinhole cameras with different sets of filters | *pinhole cameras with different sets of filters | ||
*a camera with a 50-µm slit and a step filter set (slit step-wedge (SSW) camera) | *a camera with a 50-µm slit and a step filter set (slit step-wedge (SSW) camera) | ||
| + | *To obtain time resolution, we meed fast streak camera (for example, a fast Kentech streak camera* capable of <10 ps time resolution can be used [http://www.plasmacenter.cornell.edu/docs/Poster_Presentation.pdf]) | ||
| − | '''current and voltage | + | '''current and voltage monitoring ''' |
*Rogowski coils | *Rogowski coils | ||
*B-dot | *B-dot | ||
*D-dot | *D-dot | ||
Latest revision as of 20:57, 28 February 2013
temporal X-Ray monitoring
- [1]
- several X-Ray vacuum diodes (XRDs): for extreme ultraviolet (XUV) diagnostic
- several Diamont photoconducting detectors (PCDs): for soft X-ray diagnostic < 5 - 8 kEV, resolution ~ 200 ps
- several Si-diodes (AXUV-HS diodes): for hard X-ray diagnostic, resolution ~ 700 ps, low sensitivity
- bunch of different energy filters
- Tektronix TDS684B digital oscilloscope, bandwidth 2.5 GHz, sample rate of 10 GHz. $6,272[2]
- streak camera with a step filter: slow camera ~ 100 ps, fast camera ~ 4 ps
spatial X-Ray monitoring
- [3]
- point-projection imaging to estimate the size of the X-Ray bright spots
spectral X-Ray monitoring
- [4]
- focusing spectrograph with spatial resolution (FSSR) (based on spherically bent mica crystal spectrograph)
- convex crystal spectrograph
- flat KAP spectrograph
- pinhole cameras with different sets of filters
- a camera with a 50-µm slit and a step filter set (slit step-wedge (SSW) camera)
- To obtain time resolution, we meed fast streak camera (for example, a fast Kentech streak camera* capable of <10 ps time resolution can be used [5])
current and voltage monitoring
- Rogowski coils
- B-dot
- D-dot