Difference between revisions of "TF Scratch"

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D_C:  already interviewed (2nd)
 
  
G_D: Interviewed before (3rd)
 
 
JRN: BS physics 2010
 
 
 
JRB:  CoT 2003 in laer optics,
 
 
MDG: 14 years at Intel
 
 
PEA:  microbiology
 
 
PWP:  Electrical Engineer
 
 
TJP:  Assoc in electonics,
 
 
---
 
 
ADJ:  Graduated as Electrical Tech in 2011, may have trouble focusing on feedthrough
 
 
BDB:  Electronics, May have trouble focusing
 
 
BMP:  Associates in Electromech tech, last 10 years at Intel in lithography
 
 
CWS:  May have trouble focusing on feedthrough
 
 
CAE:  EE, may have trouble focusing
 
 
CJS:  Biology,
 
 
DBK:  trouble focusing
 
 
DCP:  Trouble focusing
 
 
DKI:  Trouble focusing
 
 
JSH:  trouble focusing, micron 1991-2006
 
 
JBP: Trouble focusing
 
 
 
LDM: Trouble focusing
 
 
L_G: trouble focusing
 
 
MBC: trespassing, welder,
 
 
M_D:  trouble focusing
 
 
RLM:  trouble focusing
 
 
RJM:  trouble focusing
 
 
RJM2:  trouble focusing
 
 
RJB:  trouble focusing
 
 
RJK:  trouble focusing
 
 
SMH:  bilogy, manual laborer
 
 
SJP:  trouble focusing
 
 
TMH:  trouble focusing
 

Latest revision as of 03:19, 13 May 2012