Noise Cancellation Techniques - Revision history

Oborn: /* VFAT Channel Calibration via S-Curves */

2010-04-12T22:36:22Z

VFAT Channel Calibration via S-Curves

Oborn at 03:26, 28 March 2010

2010-03-28T03:26:09Z

Oborn at 02:42, 28 March 2010

2010-03-28T02:42:48Z

Oborn at 02:42, 28 March 2010

2010-03-28T02:42:13Z

Oborn: Created page with 'Chapter 4 Noise Cancellation Techniques Introduction As with any other real world implementation of an experiment comes the ever ubiquitous noise which completely undermines n...'

2010-03-28T02:40:01Z

Created page with 'Chapter 4 Noise Cancellation Techniques Introduction As with any other real world implementation of an experiment comes the ever ubiquitous noise which completely undermines n...'

New page

Chapter 4

Noise Cancellation Techniques

Introduction

As with any other real world implementation of an experiment comes the ever ubiquitous noise which completely undermines nearly everything one originally plans in the design stages; our experiment was no exception. It could, in fact, be stated that noise, which by definition is any unwanted signal in your electronics, was the number one issue plaguing this experiment from our original designs through completion.

By its very nature, this project specifically contains several key issues that defy common noise-cancellation techniques. What these issues are along with a brief synopsis of the common noise-cancellation techniques will be discussed.
Several noise cancellation techniques were utilized in this experiment and because of their profound consequences warrant their own chapter: the first of these is the build-in radiation protection of the VFAT2, charge-discriminating ICs, namely the Single Event Upset (SEU) triplicated logic and the Scan Chain ability for detecting erroneous digital gates; secondly, and also built into the VFAT2 controllers, are several differential-type signals that extend beyond the VFAT Breakout Board that the ISU LDS team designed; thirdly, the VFAT Breakout Board itself employs several noise cancellation techniques in its design and layout, many of which seem to defy common sense; in a similar vein are the shielding and grounding techniques applied to the experiment as a whole along with their respective pitfalls and explanations; lastly are the design and implementation of S-Curves for setting the appropriate threshold levels of the VFATs to mitigate spurious signals even after all of the aforementioned noise-cancellation techniques are utilized

Project-specific Noise

Radiation Environment and Inability to Use Active-network Noise Cancellation Techniques

Shot Noise of the GEM High-voltage Distribution Network

VFAT2 Built-in Radiation Protection

Single Event Upset (SEU) Protection

SCAN Chain

Implementation

Differential-mode vs. Common-mode Signals

VFAT Breakout Board Design

Shielding and Grounding

Implementation

Explanation

VFAT Channel Calibration via S-Curves

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 Chapter 4
-Noise Cancellation Techniques
+=Noise Cancellation Techniques=
-Introduction
+==Introduction==
 As with any other real world implementation of an experiment comes the ever ubiquitous noise which completely undermines nearly everything one originally plans in the design stages; our experiment was no exception. It could, in fact, be stated that noise, which by definition is any unwanted signal in your electronics, was the number one issue plaguing this experiment from our original designs through completion.
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 Several noise cancellation techniques were utilized in this experiment and because of their profound consequences warrant their own chapter: the first of these is the build-in radiation protection of the VFAT2, charge-discriminating ICs, namely the Single Event Upset (SEU) triplicated logic and the Scan Chain ability for detecting erroneous digital gates; secondly, and also built into the VFAT2 controllers, are several differential-type signals that extend beyond the VFAT Breakout Board that the ISU LDS team designed; thirdly, the VFAT Breakout Board itself employs several noise cancellation techniques in its design and layout, many of which seem to defy common sense; in a similar vein are the shielding and grounding techniques applied to the experiment as a whole along with their respective pitfalls and explanations; lastly are the design and implementation of S-Curves for setting the appropriate threshold levels of the VFATs to mitigate spurious signals even after all of the aforementioned noise-cancellation techniques are utilized
-Project-specific Noise
+==Project-specific Noise==
-Radiation Environment and Inability to Use Active-network Noise Cancellation Techniques
+==Radiation Environment and Inability to Use Active-network Noise Cancellation Techniques==
-Shot Noise of the GEM High-voltage Distribution Network
+==Shot Noise of the GEM High-voltage Distribution Network==
-VFAT2 Built-in Radiation Protection
+==VFAT2 Built-in Radiation Protection==
-Single Event Upset (SEU) Protection
+==Single Event Upset (SEU) Protection==
-SCAN Chain
+==SCAN Chain==
-Implementation
+===Implementation===
-Differential-mode vs. Common-mode Signals
+===Differential-mode vs. Common-mode Signals===
-VFAT Breakout Board Design
+==VFAT Breakout Board Design==
-Shielding and Grounding
+==Shielding and Grounding==
-Implementation
+===Implementation===
-Explanation
+===Explanation===
-VFAT Channel Calibration via S-Curves
+==VFAT Channel Calibration via S-Curves==